Program

Schedule

Sunday, February 24th
09:00 – 09:10Welcome from Chairs
09:10 – 10:30Keynote and Q&A
10:30 – 11:00Coffee Break + Poster Session
11:00 – 12:30 Session 1 – Clone Detection and Application
11:00 – 11:25 Yuji Fujiwara, Norihiro Yoshida, Eunjong Choi, and Katsuro Inoue
Osaka University, Japan; Nagoya University, Japan; NAIST, Japan
Code-to-Code Search Based on Deep Neural Network and Code Mutation
11:25 – 11:50 Brent van Bladel and Serge Demeyer
University of Antwerp, Belgium
A Novel Approach for Detecting Type-IV Clones in Test Code
11:50 – 12:15 Yuki Ueda, Takashi Ishio, Akinori Ihara, and Kenichi Matsumoto
NAIST, Japan; Wakayama University, Japan
Mining Source Code Improvement Patterns from Similar Code Review Works
12:15 – 12:30 Discussion
12:30 – 14:00Lunch Break
14:00 – 15:15 Session 2 – Clone Detection and Application
14:00 – 14:25 Md. Jubair Ibna Mostafa
University of Dhaka, Bangladesh
An Empirical Study on Clone Evolution by Analyzing Clone Lifetime
14:25 – 14:50 Kyohei Uemura, Akira Mori, Eunjong Choi, and Hajimu Iida
NAIST, Japan; AIST, Japan
Tracking Method-Level Clones and a Case Study
14:50 – 15:00 Joji Okada, Takashi Ishio, Yuji Sakata, and Katsuro Inoue
NTT, Japan; NAIST, Japan; Osaka University, Japan
Towards Classification of Loop Idioms Automatically Extracted from Legacy Systems
15:00 – 15:15 Discussion
15:15 – 15:30People's Choice Award, Moving Forward, and Adjourn
15:30 – 16:30Coffee Break

Accepted Papers

Code-to-Code Search Based on Deep Neural Network and Code Mutation
Yuji Fujiwara, Norihiro Yoshida, Eunjong Choi, and Katsuro Inoue
Osaka University, Japan; Nagoya University, Japan; NAIST, Japan
A Novel Approach for Detecting Type-IV Clones in Test Code
Brent van Bladel and Serge Demeyer
University of Antwerp, Belgium
Mining Source Code Improvement Patterns from Similar Code Review Works
Yuki Ueda, Takashi Ishio, Akinori Ihara, and Kenichi Matsumoto
NAIST, Japan; Wakayama University, Japan
An Empirical Study on Clone Evolution by Analyzing Clone Lifetime
Md. Jubair Ibna Mostafa
University of Dhaka, Bangladesh
Tracking Method-Level Clones and a Case Study
Kyohei Uemura, Akira Mori, Eunjong Choi, and Hajimu Iida
NAIST, Japan; AIST, Japan
Towards Classification of Loop Idioms Automatically Extracted from Legacy Systems
Joji Okada, Takashi Ishio, Yuji Sakata, and Katsuro Inoue
NTT, Japan; NAIST, Japan; Osaka University, Japan